GSM CDMA 2.5G 3G 4G 5G Phone Test SIM Card Specifications
High performance IC
Used in smart card
Body material: ABS or PVC
CPU: 8 bits
Memory (32KB):
256 bytes inner RAM (256 x 8-bit SRAM)
1KB outer RAM (1, 024 x 8-bit SRAM)
48KB program memory (48KB x 8-bit ROM)
32KB data memory (32KB x 8-bit EEPROM)
EEPROM (32KB):
32KB EEPROM as data memory
Single byte read, write and wipe
Multi-bytes storage (1 byte to 1 page)
Program clock come from vibrate clock that generated by chip itself
At the normal temperature, can precede at least 100, 000 times erase and write operating
EEPROM data endurance more than ten years
EEPROM program voltage generated in the chip
Serial I/O interface:
With IEC-7816 marks
Asynchronous half-duplex transmission protocol
Two kinds of transmission velocity (372/1 and 512/8) (optional)
Random: 8 bits
Power on reset: Internal power on reset mechanism
Low power work mode: Sleep and clock stop
Safety mechanism: Abnormal voltage, frequency detection function and DPA/SPS attacking immunity
Operating temperature: -25 to 70° C
Operating voltage: 2.7 to 3.3V and 4.5 to 5.5V
Operating frequency: 1 to 5MHz (3.57MHz)
Can be used in the Agilent 8960 and others to test set when running any GSM test or lab application
Advantages:
UMTS security variables within the SIM match the default settings of the GSM test and lab applications
Set-up time is reduced because the SIM is configured with the same default IMSI and PLMN values broadcast from the test set
For dual mode testing, GSM speech loop back is supported for GSM bit error ratio (BER) measurements
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Byron
2018-5-2